In transmission electron microscopy (TEM), where the electron beam passes through the sample to be directly imaged on the detector below, it is often necessary to support the thin samples on a grid.

The ability of single particle cryo-electron microscopy to capture structural information on samples that could not be crystallized for use with crystallographic methods or were too delicate for ...

Responsive technique: Jonathan Peters using an electron microscope at Trinity College Dublin (Courtesy: Lewys Jones and Jonathan Peters/Trinity College Dublin) A new scanning transmission electron ...

In this interview, AZoMaterials speaks with Professor Sarah Haigh, Professor of Materials Characterization at the University of Manchester, about her pioneering work in electron microscopy and its ...

With the inventions of transmission electron microscopy (TEM) in 1931 and scanning electron microscopy (SEM) shortly after in 1937, scientists gained an unprecedented ultrastructural view of the ...

ORNL researcher David Cullen has been named a Fellow of the Microscopy Society of America for significant contributions to ...

This year, the electron microscopy community marks the 25 th anniversary of the release of the first aberration-corrected transmission electron microscope. To celebrate the occasion, this article ...

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Researchers have shown that expensive aberration-corrected microscopes are no longer required to achieve record-breaking microscopic resolution. Researchers at the University of Illinois at ...

Cornell University researchers have built an AI system called EMSeek that can analyze an electron microscopy image and ...